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Dr. Serge Gavras

Explore our curated collection of technical resources, application notes, and educational content.

Application

Diatoms and Forensic Investigation: SEM Analysis for Drowning and Water Source Identification

Scanning Electron Microscopy (SEM) is a powerful tool in forensic diatom analysis, enabling high-resolution imaging and species identification to support drowning investigations. By analyzing diatom frustules with SEM, forensic scientists can link biological evidence to specific water sources, improve detection sensitivity, and strengthen conclusions in medico-legal cases.

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Application

Automotive Coatings Analysis with Tabletop SEM and EDS Using Semplor NANOS

Advanced automotive coatings require precise analysis for quality control, failure investigation, and durability assessment. Using high-resolution tabletop SEM imaging and integrated EDS, the Semplor NANOS enables detailed evaluation of coating morphology, layer structure, elemental composition, and defects—directly within automotive production and R&D environments.

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Application

Crystalline Rock Analysis and 3D Topographic Reconstruction Using Multi-Segment BSE Detection

Crystalline rock analysis using multi-segment BSE detection enables simultaneous mineral identification and three-dimensional surface reconstruction. By combining atomic number contrast with directional BSE signals, this approach delivers rapid compositional mapping and quantitative topographic measurements in a single SEM acquisition, supporting advanced geological and materials characterization.

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Figure 3 - Used dentist drill bit in BSD. Drill bit lies flat on a stub.
Application

Dental Drill Bit Imaging Using Eucentric Tilt SEM and EDS Analysis

Discover how scanning electron microscopy with eucentric tilt enables detailed imaging and microanalysis of dental drill bits. High-tilt SEM imaging combined with EDS reveals cutting-edge geometry, material composition, and wear patterns, supporting improved design, durability, and performance in dental applications.

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Application

Dental Implant Surface Analysis Using SEM for Osseointegration Characterization

Dental implant surface analysis using SEM enables three-dimensional characterization of titanium surface topography through stereoscopic imaging. The NANOS’ eucentric tilt capability (-15° to +40°) simplifies stereoscopic acquisition while integration with our Explore 3D software provides quantitative roughness measurements essential for osseointegration optimization and quality control.

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