Discover EDS

Tabletop SEM software for EDS (Energy Dispersive X-Ray) analysis, revealing the elemental composition of your sample.

Elemental analysis software

Discover EDS is a cutting-edge, fully embedded elemental analysis software designed specifically for NANOS tabletop SEM systems. It seamlessly combines high-performance elemental analysis with an intuitive user interface, delivering fast and reliable results directly within your SEM environment. Whether you're working with routine samples or handling complex material characterization, Discover EDS simplifies your workflow without compromising precision.

Key Features

All-in-One

Keep all your measurements and images organized within a single project – including SEM images, raw EDS spectra, acquisition settings, and sample locations. Easily annotate and re-analyze past data without modifying the original files.

Rapid & Reliable

Perform fast and precise elemental analysis with real-time, interactive spectrum visualization. Quickly identify peaks and artifacts using accessible reference data and simulated spectrum overlays.

Effortless Reporting

Export element maps, quantification results, line scans, or your entire project to a styled PDF or DOCX report in a single click.

Live Elemental Mapping

Get immediate results with live elemental mapping. Visualization quality continues to improve as the scan accumulates more spectra. Quickly identify features, while all raw spectra are stored for detailed analysis later.

Get Answers within Seconds

Thanks to tight integration between the Imaging and EDS apps, you can instantly analyze composition at any position in your SEM image or navigate quickly using the optical overview.

High Count-Rate

The tungsten electron source delivers high beam currents and exceptional X-ray count rates – ideal for capturing fast, low-noise, high-resolution elemental maps.

Specifications


EDS SPECIFICATIONS	Detector type	Silicon Drift Detector (SDD), thermo-electrically cooled
	Detector active area	30 mm²
	Energy resolution	@ Mn Kα < 132 eV
	Max. input count rate	300,000 cps
	Max. resolution	2048 x 2048
	Hardware integration	Fully embedded SDD, pulse processor and scan generator
SOFTWARE		Installed on Windows PC and controlled via user interface
		EDS point analysis, line analysis and mapping
		Export functions

Workflow

Dual Screen Mode

Have all your data visible at once and use multiple Apps side by side for an optimized and efficient workflow.

Advanced Map Blending

Customize your EDS maps for highly accurate elemental analysis and optimal visual representation.

Talk To A Scientist Today!

Want to know more? Please fill the form and you will be contacted shortly.