Discover EDS
Tabletop SEM software for EDS Energy Dispersive X-Ray analysis, revealing the elemental composition of your sample.
< 132 eV
Energy resolution
B (5) to Am (95)
Detectable element range
EDS analysis software for SEM
Discover EDS is a cutting-edge, fully embedded EDS Energy Dispersive X-Ray analysis software designed specifically for the NANOS scanning electron microscope. It seamlessly combines high-performance elemental analysis with an intuitive user interface, delivering fast and reliable results directly within your SEM environment. Whether you're working with routine samples or handling complex material characterization, Discover EDS simplifies your workflow without compromising precision.
Key features
Tabletop SEM technology that makes advanced microscopy accessible to every lab and researcher.
All-in-one
Keep all your measurements and images organized within a single project – including SEM images, raw EDS spectra, acquisition settings, and sample locations. Easily annotate and re-analyze past data without modifying the original files.
Rapid & Reliable
Perform fast and precise elemental analysis with real-time, interactive spectrum visualization. Quickly identify peaks and artifacts using accessible reference data and simulated spectrum overlays.
Effortless Reporting
Export element maps, quantification results, line scans, or your entire project to a styled PDF or DOCX report in a single click.
Live Elemental Mapping
Get immediate results with live elemental mapping. Visualization quality continues to improve as the scan accumulates more spectra. Quickly identify features, while all raw spectra are stored for detailed analysis later.
Get Answers within Seconds
Thanks to tight integration between the Imaging and EDS apps, you can instantly analyze composition at any position in your SEM image or navigate quickly using the optical overview.
High Count-Rate
The tungsten electron source delivers high beam currents and exceptional X-ray count rates – ideal for capturing fast, low-noise, high-resolution elemental maps.
Technical Specifications
Detailed specifications showcasing the advanced capabilities of the Discover EDS.
EDS SPECIFICATIONS |
Detector type |
Silicon Drift Detector (SDD), thermo-electrically cooled |
Detector active area |
30 mm2 |
|
Energy resolution |
@ Mn Kα < 132 eV |
|
Max. input count rate |
300,000 cps |
|
Max. resolution |
2048 x 2048 |
|
Detectable element range |
B (5) to Am (95) |
|
Hardware integration |
Fully embedded SDD, pulse processor and scan generator |
|
SOFTWARE |
Installed on Windows PC and controlled via user interface |
|
EDS point analysis, line analysis and mapping |
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Export functions |
Workflow element mapping
Try it yourself!