NANOS EBSD — High-resolution tabletop SEM with integrated EBSD capability
Combine high-resolution SEM imaging with EBSD analysis in a compact, easy-to-use tabletop platform. By analyzing diffraction patterns, it can accurately measure microstructural information such as crystal orientation, phase, and grain structure, while also enabling integrated elemental and crystallographic analysis in combination with EDS.
< 8 nm
Resolution
70°
Eucentric tilt
EBSD + EDS
Embedded
Eucentric tilt: the key to seamless EBSD
The combination of eucentric tilt and EBSD creates a seamless workflow between imaging and crystallographic analysis. You can image the sample at both 0° and the 70° EBSD position simply by tilting the stage, without breaking vacuum or repositioning the sample. Thanks to the eucentric tilt, the field of view, working distance and focus are maintained during tilting, so an area identified during imaging can be brought directly into the EBSD position without losing the region of interest. This makes switching between imaging and EBSD fast, intuitive and highly reproducible.
Key Features
Integrated EBSD functionality designed to make crystallographic analysis fast, intuitive and accessible on a tabletop SEM.
Eucentric Tilt up to 70°
Keep your region of interest centered and in focus while tilting.
Crystallographic Analysis in Tabletop SEM
Access crystal orientation and structure information directly on a tabletop SEM.
Fast & Reliable Orientation Mapping
Rapidly map crystal orientations across the sample.
Phase Identification Capability
Identify and distinguish different crystalline phases.
Compact & Integrated Design
Fully integrated EBSD functionality in a compact setup.
Combined EDS & EBSD Platform
Easily switch between EDS and EBSD analysis in the same system.
Bruker e-Flash XS EBSD
Compact EBSD detection technology designed for reliable crystallographic analysis and high-speed orientation mapping.
Bruker e-Flash XS
CMOS-based EBSD detector with high-speed pattern acquisition, user-replaceable phosphor screen and simple USB 3.0 connectivity.
View Bruker e-Flash XS|
EBSD SPECIFICATIONS
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Detector technology
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CMOS imaging chip technology
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Native image resolution
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720 x 540 pixels
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Binning modes
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2x2, 3x3, 4x4, 5x5, 6x6
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Speed
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Up to 520 frames/second (fps) in all binning modes
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Optics
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Custom-made optics system with field lens for maximizing light efficiency
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Phosphor screen
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User-replaceable phosphor screen
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Connection
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True plug-and-play (PnP) device – data and power transfer via USB 3.0 cable
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Dimensions
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Length ~84 mm (3.31 in), diameter ~48 mm (1.89 in)
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Weight
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0.85 kg
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Scan generator
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QUANTAX Scan system (external scan generator)
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