Semplor Explore Apps
Turn your NANOS tabletop SEM into a powerful material characterization platform with particle, fiber, and 3D analysis modules.
Advanced SEM Analysis at Your Fingertips
The Semplor Explore Apps transform standard SEM imaging into advanced quantitative material characterization. Seamlessly integrated into the NANOS interface, Explore Apps add powerful optional modules that are just a click away — enabling particle, fiber, and 3D analysis without leaving your SEM environment.
Key Benefits
EXPAND YOUR SEM CAPABILITIES
with advanced analysis tools
Integrated workflow
seamlessly embedded in the NANOS interface
modular flexibilty
choose the modules that fit your application
exportable date & reports
integrate results directly into research, QC pipelines or publications
Available Apps
Explore Particles
Detect, quantify, and measure particles, pores, or grains with precision. The module offers multiple segmentation methods—including thresholding and watershed—to overcome challenges in particle dispersion or sample preparation. Even touching particles can be separated and analyzed individually. Results include size, area, perimeter, shape descriptors, and count distributions, with visual overlays that clearly display particle boundaries.
Explore Fibers
Specifically designed for fiber analysis, this module measures diameter, orientation, and curvature, and can accurately trace overlapping or touching fibers. Orientation distributions and pore characteristics are automatically generated, providing valuable statistics for textiles, nonwovens, electrospun materials, and more.
Explore 3D
Generate realistic 3D reconstructions and quantitative height maps directly from SEM images. The NANOS tabletop SEM features a unique eucentric stage tilt, enabling stereoscopy for both SE and BSE images—capabilities not typically available on other SEMs. Additionally, the four-quadrant BSE detector produces calibrated topography and height maps, while single-image rendering offers fast, visually compelling 3D visualizations.
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