NANOS — The next generation desktop scanning electron microscope
A compact, robust tabletop SEM delivering high-resolution imaging and elemental analysis, without the need for a cleanroom, dedicated infrastructure, or specialist support.
< 8 nm
Resolution
EDS
Embedded
200.000x
Magnification
High-Resolution Imaging & EDS
SED, 4-quadrant BSD and embedded EDS in a single benchtop SEM.
No cleanroom required
Standard lab installation. No dedicated infrastructure or vibration isolation needed.
User Serviceable
Electron source replaceable by the user in minutes. No service visit required.
Compact, Robust & Versatile Tabletop SEM
The NANOS tabletop SEM is designed using the latest technology to deliver fast, high-quality imaging and elemental analysis. Its compact, modern design makes it ideal for R&D, educational, and industrial applications.
The NANOS provides immediate access to SEM capabilities — making it well-suited for labs looking to reduce reliance on external SEM services or to offload routine work from larger floor-model instruments. With a small footprint, excellent system stability, and no need for dedicated infrastructure, the NANOS benchtop SEM fits seamlessly into any lab environment.
Product Features
Comprehensive capabilities designed for demanding analytical workflows
High-Performance SE & BSE Detectors
The NANOS desktop SEM is equipped with a Secondary Electron Detector (SED) for high-resolution surface topography imaging, and a high-quality 4-quadrant Backscattered Electron Detector (BSD) for compositional contrast. The BSD quadrant design enables advanced imaging modes including topographical shading, providing valuable insights into surface roughness and material properties. Mixed-mode imaging allows simultaneous SE and BSE signals to be overlaid or displayed side-by-side for comprehensive sample analysis.
Learn moreIntegrated EDS Analysis
The NANOS includes an embedded Silicon Drift Detector (SDD) for Energy Dispersive Spectroscopy (EDS). With an active area of 30 mm² and an energy resolution of <132 eV at Mn Kα, the detector supports point analysis, line scans and full element mapping — all within the same interface as SEM imaging, without external hardware or software.
Learn moreLow Vacuum Mode
The NANOS operates in both high- and low-vacuum modes. In low-vacuum mode (40 Pascal), charging effects on non-conductive samples are reduced or eliminated, often removing the need for sputter coating. Switching between modes requires a single click in the software interface.
Learn moreEucentric Tilt Stage
The NANOS includes a eucentric tilt stage as standard, ensuring samples remain in focus during tilting without requiring adjustments to SEM settings. Motorized XY movement is software-controlled (25 × 25 mm travel), while tilt angles up to 55° are manually adjusted with real-time on-screen feedback.
Learn moreUser-Replaceable Source
The thermionic tungsten filament delivers 1,000+ operating hours in ECO-mode. When replacement is needed, users can swap the source themselves using a simple alignment tool — no service visit, no specialist required. This minimizes downtime and reduces cost of ownership compared to systems requiring external servicing.
Learn moreDiscover Platform
The Semplor Discover Platform provides an intuitive single-screen interface for SEM imaging and EDS analysis, requiring minimal training. Users with varying levels of SEM experience can achieve high-quality results quickly. The system is delivered pre-configured on a 27" All-in-One PC with all software pre-installed.
Watch overviewOptical Navigation Camera
Upon sample insertion, the NANOS displays a full-field color optical image of the sample surface. This enables rapid identification of areas of interest before switching to electron imaging — a practical feature for efficient, high-throughput workflows.
1–20 kV Accelerating Voltage
Adjustable acceleration voltages from 1 to 20 kV provide flexibility across a wide range of sample types and analytical requirements. Lower voltages are suited to beam-sensitive samples; higher voltages improve EDS signal yield and mapping efficiency.
Clean vacuum chamber
The NANOS contains no moving mechanical parts inside the vacuum chamber — a unique design feature. This eliminates the risk of contamination and mechanical failure, reduces maintenance requirements, and ensures consistent imaging performance over time.
Learn moreAnalytical Software
The NANOS is available with two optional software modules, fully embedded in the Discover interface.
Discover EDS
Unlock the full analytical potential of the NANOS with Semplor's Discover EDS software. From live elemental mapping to precise peak identification and quantification, Discover EDS streamlines every step of the analytical workflow.
- Live spectrum display
- Instant element identification and quantification
- Advanced map blending, line scan analysis
- One-click reporting
Explore Apps — Particles, Fibers & 3D
The Semplor Explore App transforms standard SEM imaging into advanced material characterization. Three optional modules are available:
Explore Particles
Automated detection, segmentation and measurement of particles, pores and grains, including touching particles. Outputs include size distributions, shape descriptors and exportable statistical reports.
Explore Fibers
Diameter, orientation and curvature measurement for fiber analysis. Designed for textiles, nonwovens, electrospun materials and fiber-based samples.
Explore 3D
3D reconstruction and quantitative height maps from SEM images, using stereo pair reconstruction, 4-quadrant BSD topography, or single-image rendering.
Applications
The NANOS tabletop SEM is used across a wide range of research, industrial and environmental applications. Each application combines high-resolution SEM imaging with elemental analysis (EDS) and optional advanced software modules.
Asbestos & Fiber Analysis
Fiber identification and elemental characterization for regulatory compliance
Read more
Materials Characterization
Surface morphology, compositional contrast, elemental distribution in metals, ceramics, polymers and composites
Read more
Particle Analysis
Automated detection, sizing and classification of particles, pores and inclusions
Read more
Failure Analysis
Surface defect investigation, fracture analysis and contamination identification
Read more
Forensic Investigation
Material identification, trace element analysis and fiber evidence characterization
Read more
Coating & Surface Analysis
Coating thickness, adhesion and elemental composition in automotive, aerospace and industrial coatings
Read moreImages captured with NANOS
Explore stunning high-resolution images captured with the NANOS tabletop SEM.
Technical Specifications
IMAGING MODE |
Optical |
2 & 12x optical with up to 60x digital zoom |
SEM |
Magnification range: 100 - 200.000x |
|
Resolution |
<8 nm |
|
Capture resolution |
Up to 4096 x 4096 pixels (4K) |
|
ILLUMINATION |
Light optical |
Bright field |
Electron optical |
Optimized thermionic source (tungsten) |
|
Lifetime: 1000+ operating hours in ECO-mode |
||
Acceleration voltages |
Default: 1, 2, 5, 7, 10, 15 & 20 kV |
|
DETECTOR |
Secondary electron detector (SED) |
|
Backscattered electron detector (BSD) – 4 quadrant |
||
Energy Dispersive Spectroscopy detector (EDS) – embedded |
||
LIGHT OPTICAL NAVIGATION CAMERA |
Color |
|
IMAGE FORMATS |
JPEG, TIFF, PNG, BMP |
|
USER INTERFACE |
Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard |
|
Remote control and diagnostic enabled |
||
DATA STORAGE |
Network, USB, workstation |
|
SAMPLE STAGE |
Eucentric tilt stage (+15° up to -40° ) manual |
|
Computer-controlled motorized X, Y: 25 x 25 mm |
||
SAMPLE SIZE |
Up to 45 mm diameter (max +15° to -15° tilt) |
|
Up to 19 mm height (optional 40 mm) |
||
EDS SPECIFICATIONS |
Detector type |
Silicon Drift Detector (SDD), thermo-electrically cooled |
Detector active area |
30 mm2 |
|
Energy resolution |
@ Mn Kα < 132 eV |
|
Max. input count rate |
300,000 cps |
|
Hardware integration |
Fully embedded SDD, pulse processor and scan generator |
|
SOFTWARE |
Installed on Windows PC and controlled via user interface |
|
EDS point analysis, line analysis and mapping |
||
Export functions |
||
SYSTEM SPECIFICATIONS |
Footprint |
280 (w) x 470 (d) x 550 (h) mm |
Weight |
62 kg |
|
Pumps |
Pfeiffer Turbo molecular pump and an oil free membrane pre-vacuum pump |
|
Vacuum modes |
High vacuum SEM mode (standard)
Low vacuum mode (standard): vacuum of 40 Pascal for reduced charging |
|
Motor controlled vacuum levels via the User Interface |
||
Workstation |
Preconfigured All-in-One PC with a 27” monitor.
SEM imaging and EDS Analysis software installed |
|
AMBIENT CONDITIONS |
Temperature |
15°C - 25°C (59°F - 77°F) |
Humidity |
20 - 80% RH |
|
Power |
System typically in imaging mode: 110 W (max. 140 W) |
SEMPLOR
Featured Resources
Explore our curated collection of technical resources, application notes, and educational content.
Frequently Asked Questions
No. The NANOS operates in a standard lab environment on a regular power outlet (110 W typical, 140 W max). No cleanroom, vibration isolation or dedicated air conditioning is required. Footprint: 280 × 470 × 550 mm, weight: 62 kg.
The NANOS delivers comparable imaging and EDS capabilities for the majority of routine research and industrial applications, at a significantly lower cost and without infrastructure requirements. Floor-standing instruments may offer higher ultimate resolution for specialist applications; for routine characterization, the NANOS provides equivalent results with lower total cost of ownership.
The NANOS uses a thermionic tungsten filament. In ECO-mode, this provides 1,000+ operating hours and can be replaced by the user in minutes without a service visit. CeB₆ sources offer longer lifetime and higher brightness; tungsten sources offer lower cost of ownership and simpler user maintenance. The right choice depends on application requirements and budget.
No. The Discover Platform is designed for users with varying levels of experience. Most users achieve high-quality results on their first day of operation.
Minimal preparation is required for most samples. Non-conductive samples can be imaged in low-vacuum mode (40 Pascal) to reduce charging effects, often removing the need for sputter coating. Standard preparation applies for high-vacuum imaging.
The NANOS supports the electron microscopy-based fiber identification and elemental analysis required under EU Directive 2023/2668. Contact us to discuss compliance requirements for your specific application.
No. Both are optional software modules available separately. The base NANOS includes SEM imaging software. Contact us for a quote including your preferred configuration.
Request a Demo or Quote
The NANOS is available through our global distributor network. Contact us to discuss your application, request a live demonstration, or receive a quote for your preferred configuration.