Explore our curated collection of technical resources, application notes, and educational content.

 Mechatronics Technician

Functietitel: Mechatronica-technicus Locatie: Eindhoven, Nederland Bedrijf: Semplor Over ons Semplor is een toonaangevende innovator op het gebied van elektronenmicroscopietechnologie, gespecialiseerd in tafelmodel scanning-elektronenmicroscopen (SEM’s). Onze geavanceerde SEM-oplossingen zijn ontworpen om

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Application Specialist

Job Title: Application Specialist Location: Eindhoven, Netherlands Company: Semplor About Us: Semplor is a leading innovator in electron microscopy technology, specialized in tabletop Scanning Electron Microscopes (SEMs). Our cutting-edge SEM

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Application

Diatoms and Forensic Investigation: SEM Analysis for Drowning and Water Source Identification

Scanning Electron Microscopy (SEM) is a powerful tool in forensic diatom analysis, enabling high-resolution imaging and species identification to support drowning investigations. By analyzing diatom frustules with SEM, forensic scientists can link biological evidence to specific water sources, improve detection sensitivity, and strengthen conclusions in medico-legal cases.

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Application

Automotive Coatings Analysis with Tabletop SEM and EDS Using Semplor NANOS

Advanced automotive coatings require precise analysis for quality control, failure investigation, and durability assessment. Using high-resolution tabletop SEM imaging and integrated EDS, the Semplor NANOS enables detailed evaluation of coating morphology, layer structure, elemental composition, and defects—directly within automotive production and R&D environments.

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Application

Crystalline Rock Analysis and 3D Topographic Reconstruction Using Multi-Segment BSE Detection

Crystalline rock analysis using multi-segment BSE detection enables simultaneous mineral identification and three-dimensional surface reconstruction. By combining atomic number contrast with directional BSE signals, this approach delivers rapid compositional mapping and quantitative topographic measurements in a single SEM acquisition, supporting advanced geological and materials characterization.

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