Technology
The NANOS is a comprehensive and affordable tabletop scanning electron microscope (SEM). It is engineered using the latest technology, giving fast and high quality SEM images and elemental analysis. Its design is robust and modern, which makes it perfect for research & development, educational and industrial usage.
Eucentric stage
Easily replacable electron source
High performance detectors
Secondary Electron Detector
Captures low-energy secondary electrons for exceptional surface topography imaging. Ideal for revealing fine surface details and texture at high magnification.
Key Features:
- Surface topography
- High resolution imaging
- Material contrast
Backscattered Electron Detector
Detects high-energy backscattered electrons to provide compositional contrast. Heavier elements appear brighter, enabling material differentiation.
Key Features:
- Compositional contrast
- Subsurface information
- Low-vacuum capability
Energy Dispersive X-ray Spectroscopy
Integrated X-ray detector for simultaneous elemental analysis. Identifies and quantifies elements with ≤132 eV resolution.
Key Features:
- Elemental identification
- Quantitative analysis
- Elemental mapping
Flexible Vacuum Technology
Switch between high and low vacuum modes to accommodate any sample type without compromise. Standard included in the NANOS tabletop SEM
Eucentric stage standard included
The Eucentric Stage of the NANOS is truly the only one of its kind. It comes standard with the NANOS. The motorized XY movements can easily be controlled by a click of the mouse. Tilting the specimen while in SEM mode can be done by manually turning the stage. Thanks to the eucentric design, the sample stays in focus without the need for intermediate changes in SEM settings. On the monitor the exact tilt angle is indicated. Samples can be tilted up to angles of 55 degrees.
Mixed mode BSE & SE images
BSE and SE images can be simultaneously viewed in a single composite image. Images can either be overlaid or compared side by side.
Directional Topography Imaging
4-quadrant BSE detector enables directional shadow control for enhanced 3D visualization of surface features.
Embedded Elemental Analysis
Integrated Silicon Drift Detector (SDD) provides powerful EDS capabilities for complete material characterization.
Complete Elemental Analysis
The integrated EDS system provides quantitative and qualitative elemental analysis from Boron (B) to Americium (Am), with industry-leading energy resolution.
Point Analysis
Identify elements at specific locations with single-click accuracy.
Line Scan
Track elemental distribution along user-defined paths.
Mapping
Generate color-coded elemental distribution maps.
Quantification
Automatic standardless quantification with ZAF correction.
Flexible Accelerating Voltage
Seven optimized voltage presets from 1 to 20 kV provide the perfect balance between resolution and sample interaction.
Perfect balance for most imaging applications.
Easily replaceable electron source
Integrated Silicon Drift Detector (SDD) provides powerful EDS capabilities for complete material characterization.
Quick & Easy Replacement
- Complete in under 15 minutes
- Straightforward alignment with included alignment tool
- Source-swappable design minimizes downtime significantly
- Source replacement is very low in costs
- No service engineer needed
Filament Operating Modes
Technical Specifications
Detailed specifications showcasing the advanced capabilities of the NANOS system.
IMAGING MODE |
Optical |
2 & 12x optical with up to 60x digital zoom |
SEM |
Magnification range: 100 - 200.000x |
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Resolution |
<8 nm |
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Capture resolution |
Up to 4096 x 4096 pixels (4K) |
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ILLUMINATION |
Light optical |
Bright field |
Electron optical |
Optimized thermionic source (tungsten) |
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Lifetime: 1000+ operating hours in ECO-mode |
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Acceleration voltages |
Default: 1, 2, 5, 7, 10, 15 & 20 kV |
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DETECTOR |
Secondary electron detector (SED) |
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Backscattered electron detector (BSD) – 4 quadrant |
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Energy Dispersive Spectroscopy detector (EDS) – embedded |
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LIGHT OPTICAL NAVIGATION CAMERA |
Color |
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IMAGE FORMATS |
JPEG, TIFF, PNG, BMP |
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USER INTERFACE |
Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard |
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Remote control and diagnostic enabled |
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DATA STORAGE |
Network, USB, workstation |
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SAMPLE STAGE |
Eucentric tilt stage (+15° up to -40° ) manual |
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Computer-controlled motorized X, Y: 25 x 25 mm |
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SAMPLE SIZE |
Up to 45 mm diameter (max +15° to -15° tilt) |
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Up to 19 mm height (optional 40 mm) |
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EDS SPECIFICATIONS |
Detector type |
Silicon Drift Detector (SDD), thermo-electrically cooled |
Detector active area |
30 mm2 |
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Energy resolution |
@ Mn Kα < 132 eV |
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Max. input count rate |
300,000 cps |
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Hardware integration |
Fully embedded SDD, pulse processor and scan generator |
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SOFTWARE |
Installed on Windows PC and controlled via user interface |
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EDS point analysis, line analysis and mapping |
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Export functions |
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SYSTEM SPECIFICATIONS |
Footprint |
280 (w) x 470 (d) x 550 (h) mm |
Weight |
62 kg |
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Pumps |
Pfeiffer Turbo molecular pump and an oil free membrane pre-vacuum pump |
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Vacuum modes |
High vacuum SEM mode (standard)
Low vacuum mode (standard): vacuum of 40 Pascal for reduced charging |
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Motor controlled vacuum levels via the User Interface |
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Workstation |
Preconfigured All-in-One PC with a 27” monitor.
SEM imaging and EDS Analysis software installed |
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AMBIENT CONDITIONS |
Temperature |
15°C - 25°C (59°F - 77°F) |
Humidity |
20 - 80% RH |
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Power |
System typically in imaging mode: 110 W (max. 140 W) |
Ready to revolutionize your imaging workflow?
Join hundreds of researchers who have already made the switch to the NANOS tabletop SEM