Technology
Explore the NANOS
The NANOS is acomprehensive and affordable tabletop scanning electron microscope (SEM), also called benchtop or desktop SEM. It is engineered using the latest technology, giving fast and high quality SEM images and elemental analysis. Its design is robust and modern, which makes it perfect for research & development, educational and industrial usage.
Detectors
The NANOS comes with both a Secondary Electron Detector (SED) and a Back Scattered Electron Detector (BSD) as standard. The BSD is a 4-quadrant detector with fully controllable independent segments. By utilizing the segments in different combinations, it provides compositional or topographical detail from the sample, as well as images with a ‘shading-effect’ by highlighting the surface from multiple directions. An Energy Dispersive X-ray (EDX) Silicon Drift Detector (SDD) is installed for Elemental Analysis.
Elemental analysis
The NANOS is equipped with a fully integrated Energy Dispersive X-ray (EDX) Silicon Drift Detector (SDD). The operator can select EDX Point Analysis or activate Elemental Mapping.
Eucentric stage
The Eucentric Stage of the NANOS is truly the only one of its kind. It comes standard with the NANOS. The motorized XY movements can be controlled via the User Interface. Tilting the specimen while in SEM mode can be done by manually turning the stage. Thanks to the eucentric design, the sample stays in focus without the need for intermediate changes in SEM settings. The User Interface indicates the exact tilt angle. Samples can be tilted up to angles of 55.
CONFIGURATION: the NANOS is delivered with BSD, SED, integrated EDS and a Eucentric tilt stage.
DESIGN: the NANOS has a robust modern design & is engineered using the latest materials and components.
SERVICING: the NANOS design allows easy access for maintenance and upgrades which can be completed at your premises.
ROBUST: with excellent stability and a small footprint the architecture of the NANOS ensures it can be used in non-laboratory environments.
EASE OF USE: in BASIC mode the NANOS will produce results in a short period of time, regardless of experience. ADVANCED mode provides further functionality for detailed analysis.
COST OF OWNERSHIP: the NANOS has been engineered to keep the cost of ownership lower than any benchtop SEM currently available
CONFIGURATION: the NANOS is delivered with BSD, SED, integrated EDS and a Eucentric tilt stage.
DESIGN: the NANOS has a robust modern design & is engineered using the latest materials and components.
SERVICING: the NANOS design allows easy access for maintenance and upgrades which can be completed at your premises.
ROBUST: with excellent stability and a small footprint the architecture of the NANOS ensures it can be used in non-laboratory environments.
EASE OF USE: in BASIC mode the NANOS will produce results in a short period of time, regardless of experience. ADVANCED mode provides further functionality for detailed analysis.
COST OF OWNERSHIP: the NANOS has been engineered to keep the cost of ownership lower than any benchtop SEM currently available
User interface
SEM’s are about imaging and the NANOS puts the image at the centre of the screen. The NANOS is simple to set up and with an intuitive interface and requires minimal training to begin imaging samples. The software offers both Basic mode for those requiring a quick & simple start to SEM imaging and Advanced mode for in-depth sample analysis. The user is in full control of the NANOS via wireless scroll mouse & keyboard and can be set up to operate remotely controlled via an iPad or similar device. The Navigation Camera, (NavCam) is always enabled ensuring the user knows exactly where they are on their sample.
Navigation camera
At sample entry an optical image of the sample is madeto serve as navigation image. It provides an image of the complete sample. Via the User Interface the user can easily navigate over the sample. It gives the user full control and even in high magnification they always know where they are looking at.
Low-vacuum reduces sample charging
Specimens are observed in high vacuum SEM (conventional SEM) or in low vacuum (low-vacuum SEM). The low-vacuum is used to reduce or eliminate the effects of sample charging. Whenanon-conductive sample is observed under a high- vacuum state, electrons accumulate on the sample surface causing a charging phenomenon. The NANOS is equipped with low-vacuum mode to overcome this.
Easily compare your SE and BSE captures
Electron source
The thermionic electron source in the NANOS is a tungsten filament controlled by electro-magnetic coil lenses & electrostatic deflectors. Using the optional ‘eco’-setting, the filament lifetime can be extended up to hundreds of hours and still generate high resolution images. Any user can replace the electron source with a simple alignment tool, ensuring a minimum downtime. Noneed to wait for a service engineer to replace an expensive source.
Accelerating voltages
Adjustable accelerating voltage between 1kV to 20kV ensures high speed EDS analysis and mapping for identifying elements in your samples.
Maintenance
The NANOS has been developed with service at the core of its design. Removable panels, modular components, a single control board and few moving parts keep service requirements to a minimum. Much can be undertaken by the user. Unique for the NANOS is that there are no moving parts within the vacuum chamber. Due to this smart design the risk for contamination has been eliminated.
Specifications
IMAGING MODE
|
Optical
|
2 & 12x optical Up to 60x digital zoom |
SEM
|
Magnification range: 100 - 200.000x
| |
Resolution
|
<8 nm
| |
ILLUMINATION
|
Optical
|
Bright field
|
SEM
|
Optimized thermionic source (tungsten)
| |
Acceleration voltages
|
Default: 1, 2, 5, 7, 10, 15 & 20 kV
| |
DETECTOR
|
Secondary electron detector (SED)
| |
Backscattered electron detector (BSD) – 4 quadrant
| ||
Energy Dispersive Spectroscopy detector (EDS) – embedded
| ||
LIGHT OPTICAL NAVIGATION CAMERA
|
Color
| |
IMAGE FORMATS
|
JPEG, TIFF, PNG, BMP
| |
USER INTERFACE
|
Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard
| |
Remote control and diagnostic enabled
| ||
DATA STORAGE
|
Network, USB, workstation
| |
SAMPLE STAGE
|
Eucentric tilt stage (+15 up to -40 ̊) manual
| |
Computer-controlled motorized X, Y: 25 x 25 mm
| ||
SAMPLE SIZE
|
Up to 45 mm diameter
| |
Up to 14 mm height (optional 45 mm)
| ||
EDS SPECIFICATIONS
|
Detector type
|
Silicon Drift Detector (SDD), thermo-electrically cooled
|
Detector active area
|
30 mm2
| |
Energy resolution
|
@ Mn Kα < 133 eV
| |
Max. input count rate
|
300,000 cps
| |
Hardware integration
|
Fully embedded SDD, pulse processor and scan generator
| |
SOFTWARE
|
Installed on Windows PC and controlled via user interface
| |
EDS point analysis, line analysis and mapping
| ||
Export functions
| ||
SYSTEM SPECIFICATIONS
|
Imaging module
|
280 (w) x 470 (d) x 550 (h) mm
|
Weight
|
62 kg
| |
Pumps
|
Pfeiffer Turbo molecular pump and an oil free membrane pre-vacuum pump
| |
Vacuum modes
|
High vacuum SEM mode (standard)
Low vacuum mode (standard): vacuum of 40 Pascal for reduced charging
| |
Motor controlled vacuum levels via the User Interface
| ||
Workstation
|
Preconfigured All-in-One PC with a 27” monitor.
SEM imaging and EDS Analysis software installed
|